CLASS LABEL NOISE
Experts
- Sotiris B. Kotsiantis
- Robert Sabourin
- Araceli Sanchis
- Agapito Ledezma
- José Antonio Iglesias
- Alberto Suárez
- Fulufhelo V. Nelwamondo
- Lokender Tiwari
- Dipankar Das
- Benedek Rozemberczki
- Jiazhi Xia
- Stephen Kwek
- Licheng Jiao
- Boguslaw Cyganek
- Ashfaqur Rahman
- Anish Madan
- Lanxi Xiao
- Subhashis Banerjee
- Lin Xiong
- Jun Zhu
- Shasha Mao
- Taghi M. Khoshgoftaar
- Shixia Liu
- Xingxing Zhang
- Zhongyuan Wang
- Saket Anand
- Rik Sarkar
- Bharat Kaul
- Weikai Yang
- Alexander Logvinovsky
- Berthold Lausen
- Vagan Y. Terziyan
- Torsten Hothorn
- Brijesh K. Verma
- Gonzalo Martínez-Muñoz
- Apoorv Vyas
- Seppo Puuronen
- Xi Ye
- Amitava Karmaker
Venues
- CoRR
- Pattern Recognit.
- Multim. Tools Appl.
- IJCNN
- Eng. Appl. Artif. Intell.
- SemEval@COLING
- Neurocomputing
- Appl. Intell.
- Artif. Intell. Rev.
- Soft Comput.
- IGARSS
- Remote. Sens.
- MCPR
- ICTAI
- ICIST
- IEEE Access
- IWANN
- Expert Syst. J. Knowl. Eng.
- Int. J. Pattern Recognit. Artif. Intell.
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- WACV
- ICSAI
- Neural Process. Lett.
- ICPR (2)
- Comput. Geosci.
- HCI (2)
- DEXA Workshop
- J. Comput. Virol.
- Inf.
- ACIIDS (2)
- CIRA
- ICEIS (2)
- ICONIP (2)
- SMC
- e Informatica Softw. Eng. J.
- CLEF (Working Notes)
- ICPR
- Int. J. Syst. Sci.
- Comput. Electr. Eng.
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