CLASS LABEL NOISE
Experts
- Sotiris B. Kotsiantis
- Robert Sabourin
- Araceli Sanchis
- Agapito Ledezma
- Alexander Logvinovsky
- Theodore L. Willke
- Bharat Kaul
- Rik Sarkar
- Torsten Hothorn
- Xia Zhu
- Saket Anand
- Xi Ye
- Maryam Sabzevari
- Xingxing Zhang
- Benedek Rozemberczki
- Licheng Jiao
- Hanspeter Pfister
- Anish Madan
- Panayiotis E. Pintelas
- Seppo Puuronen
- Subhashis Banerjee
- Alberto Suárez
- Jiazhi Xia
- Ashfaqur Rahman
- Lanxi Xiao
- Vagan Y. Terziyan
- Dipankar Das
- Jun Zhu
- Apoorv Vyas
- Taghi M. Khoshgoftaar
- Nataraj Jammalamadaka
- Fulufhelo V. Nelwamondo
- Berthold Lausen
- Lokender Tiwari
- Boguslaw Cyganek
- José Antonio Iglesias
- Brijesh K. Verma
- Amitava Karmaker
- Gonzalo Martínez-Muñoz
Venues
- CoRR
- Pattern Recognit.
- Multim. Tools Appl.
- Eng. Appl. Artif. Intell.
- IGARSS
- Remote. Sens.
- SemEval@COLING
- IJCNN
- Appl. Intell.
- Soft Comput.
- Neurocomputing
- Artif. Intell. Rev.
- MCPR
- ICTAI
- CCECE
- SLaTE
- Expert Syst. J. Knowl. Eng.
- RSEISP
- EAIS
- Intell. Syst. Account. Finance Manag.
- Int. J. Pattern Recognit. Artif. Intell.
- IEEE Geosci. Remote. Sens. Lett.
- ICONIP (5)
- J. Biomed. Informatics
- Int. J. Artif. Intell. Tools
- Comput. Electr. Eng.
- SVM
- ICDM
- ICIST
- Inf.
- Log. J. IGPL
- CLEF (Working Notes)
- UEMCON
- MICAI (1)
- IEEE Trans. Knowl. Data Eng.
- NIPS
- IEEE Access
- CIKM
- DEXA
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