CLASS LABEL NOISE
Experts
- Sotiris B. Kotsiantis
- Araceli Sanchis
- Agapito Ledezma
- Robert Sabourin
- Maryam Sabzevari
- Xia Zhu
- Hanspeter Pfister
- Panayiotis E. Pintelas
- Theodore L. Willke
- Seppo Puuronen
- Torsten Hothorn
- Brijesh K. Verma
- Vagan Y. Terziyan
- Apoorv Vyas
- Gonzalo Martínez-Muñoz
- Nataraj Jammalamadaka
- Amitava Karmaker
- Xi Ye
- Saket Anand
- Rik Sarkar
- Shixia Liu
- Taghi M. Khoshgoftaar
- Xingxing Zhang
- Zhongyuan Wang
- Alexander Logvinovsky
- Berthold Lausen
- Bharat Kaul
- Weikai Yang
- Licheng Jiao
- Ashfaqur Rahman
- Anish Madan
- Boguslaw Cyganek
- Fulufhelo V. Nelwamondo
- Alberto Suárez
- Lokender Tiwari
- Dipankar Das
- Benedek Rozemberczki
- Jiazhi Xia
- Stephen Kwek
Venues
- CoRR
- Pattern Recognit.
- Remote. Sens.
- IGARSS
- Soft Comput.
- ICTAI
- MCPR
- Eng. Appl. Artif. Intell.
- IJCNN
- SemEval@COLING
- Multim. Tools Appl.
- Appl. Intell.
- Artif. Intell. Rev.
- Neurocomputing
- UEMCON
- Future Gener. Comput. Syst.
- ICPR
- ISDA
- SETN
- CCECE
- COMPSTAT
- ECCV (8)
- ICC Workshops
- CIKM
- PAKDD
- PRIS
- AICAS
- ICCV
- NLPmJ@EMNLP
- MCS
- DEXA
- Int. J. Artif. Intell. Tools
- MICAI (1)
- IEEE Trans. Knowl. Data Eng.
- ICASSP
- Knowl. Based Syst.
- RSEISP
- ADMA (2)
- SVM
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