ABNORMAL EVENT DETECTION
Experts
- Hichem Snoussi
- Moin Nabi
- Mahdyar Ravanbakhsh
- Tian Wang
- Nicu Sebe
- Enver Sangineto
- Radu Tudor Ionescu
- Xinyu Wu
- Xiaoqiang Lu
- Mariana-Iuliana Georgescu
- Huiwen Guo
- Marius Popescu
- Fahad Shahbaz Khan
- Limin Xia
- Samir Bouindour
- Hak Gu Kim
- Simon Denman
- Clinton Fookes
- Sridha Sridharan
- Guangmin Hu
- Yunde Jia
- Prabir Kumar Biswas
- N. Patil
- Michèle Gouiffès
- Jongmin Yu
- Sangmin Lee
- Yong Man Ro
- Yuan Yuan
- Yachuang Feng
- Victor Sanchez
- Roberto Leyva
- Moongu Jeon
- Che Sun
- Chang-Tsun Li
- Hongyang Chao
- Huan Wang
- Angélique Loesch
- Runze Su
- Aggelos K. Katsaggelos
Venues
- CoRR
- Multim. Tools Appl.
- Sensors
- AVSS
- ICIP
- J. Electronic Imaging
- ACM Multimedia
- Neurocomputing
- ICASSP
- Mach. Vis. Appl.
- CVPR
- ICME
- EMBC
- Signal Image Video Process.
- CVPR Workshops
- EURASIP J. Adv. Signal Process.
- IEEE Trans. Multim.
- Pattern Recognit. Lett.
- ROBIO
- IROS
- J. Electr. Comput. Eng.
- ICCV
- AAAI
- Pattern Recognit.
- IEEE Access
- Int. J. Distributed Sens. Networks
- ICME Workshops
- WACV
- IET Image Process.
- UbiComp/ISWC Adjunct
- VISIGRAPP (3: VISAPP)
- CCCV (1)
- SPAC
- Inf. Sci.
- IDEAL
- ICIMCS
- CCIS
- J. Biomed. Informatics
- Int. J. Comput. Vis. Image Process.
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