AAM FITTING
Experts
- Iain A. Matthews
- Simon Baker
- Timothy F. Cootes
- Christopher J. Taylor
- Maja Pantic
- Georgios Tzimiropoulos
- Horst Bischof
- Milan Sonka
- Takeo Kanade
- Daijin Kim
- Dacheng Tao
- Reinhard Beichel
- Jeffrey F. Cohn
- Julien Peyras
- Stefanos Zafeiriou
- Changbo Hu
- Joan Alabort-i-Medina
- Jing Xiao
- Yangsheng Wang
- Ralph Gross
- Jean Kossaifi
- Mohammad H. Mahoor
- Sridha Sridharan
- Mikkel B. Stegmann
- Adrien Bartoli
- Xuelong Li
- Shiguang Shan
- Simon Lucey
- Kevin N. Walker
- Ali Mollahosseini
- Marius D. Cordea
- Jia-Da Li
- Hugo Mercier
- Patrice Dalle
- Judith E. Adams
- Reza Shoja Ghiass
- Seth Koterba
- Pedro Martins
- Ching-Hsien Hsu
Venues
- CoRR
- BMVC
- ICCV
- ICIP
- FG
- IEEE Trans. Image Process.
- Int. J. Comput. Vis.
- CVPR
- Pattern Recognit.
- CVPR Workshops
- Image Vis. Comput.
- FGR
- Knowl. Based Syst.
- IEEE Trans. Pattern Anal. Mach. Intell.
- IPMI
- SMC
- VISAPP (1)
- IEEE Access
- IEEE Trans. Affect. Comput.
- Neurocomputing
- VISIGRAPP (5: VISAPP)
- VISAPP (2)
- Medical Imaging: Image Processing
- AAAI
- Vis. Comput.
- Comput. Vis. Image Underst.
- EUSIPCO
- AVSS
- MIRAGE
- Neural Process. Lett.
- Bildverarbeitung für die Medizin
- ICDM
- IROS
- IEEE Trans. Inf. Forensics Secur.
- IEEE Trans. Knowl. Data Eng.
- ICASSP
- WACV
- Arch. Mus. Informatics
- BTAS
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