AAM FITTING
Experts
- Simon Baker
- Iain A. Matthews
- Timothy F. Cootes
- Christopher J. Taylor
- Horst Bischof
- Georgios Tzimiropoulos
- Maja Pantic
- Milan Sonka
- Takeo Kanade
- Julien Peyras
- Jeffrey F. Cohn
- Reinhard Beichel
- Daijin Kim
- Dacheng Tao
- Ralph Gross
- Yangsheng Wang
- Jing Xiao
- Joan Alabort-i-Medina
- Changbo Hu
- Stefanos Zafeiriou
- Mikkel B. Stegmann
- Sridha Sridharan
- Mohammad H. Mahoor
- Jean Kossaifi
- Ali Mollahosseini
- Simon Lucey
- Kevin N. Walker
- Shiguang Shan
- Xuelong Li
- Adrien Bartoli
- Chengcheng Wang
- Petros Maragos
- Chu-Song Chen
- Xavier Maldague
- Martin G. Roberts
- Qingqing Zheng
- Andreas Ernst
- Hang Zhou
- Tetsunori Kobayashi
Venues
- CoRR
- BMVC
- ICCV
- ICIP
- FG
- IEEE Trans. Image Process.
- Int. J. Comput. Vis.
- CVPR
- Pattern Recognit.
- CVPR Workshops
- Image Vis. Comput.
- FGR
- Neurocomputing
- VISIGRAPP (5: VISAPP)
- IEEE Trans. Affect. Comput.
- VISAPP (1)
- SMC
- IEEE Access
- IEEE Trans. Pattern Anal. Mach. Intell.
- IPMI
- Knowl. Based Syst.
- Vis. Comput.
- VISAPP (2)
- Medical Imaging: Image Processing
- AAAI
- Neural Process. Lett.
- Bildverarbeitung für die Medizin
- ICDM
- EUSIPCO
- AVSS
- MIRAGE
- Comput. Vis. Image Underst.
- Arch. Mus. Informatics
- WACV
- ICASSP
- IEEE Trans. Knowl. Data Eng.
- IEEE Trans. Inf. Forensics Secur.
- IROS
- IEEE Trans. Circuits Syst. Video Technol.
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