AAM FITTING
Experts
- Simon Baker
- Iain A. Matthews
- Timothy F. Cootes
- Christopher J. Taylor
- Maja Pantic
- Horst Bischof
- Georgios Tzimiropoulos
- Milan Sonka
- Takeo Kanade
- Yangsheng Wang
- Daijin Kim
- Ralph Gross
- Jeffrey F. Cohn
- Joan Alabort-i-Medina
- Jing Xiao
- Reinhard Beichel
- Julien Peyras
- Dacheng Tao
- Stefanos Zafeiriou
- Changbo Hu
- Mikkel B. Stegmann
- Simon Lucey
- Jean Kossaifi
- Xuelong Li
- Adrien Bartoli
- Mohammad H. Mahoor
- Shiguang Shan
- Ali Mollahosseini
- Sridha Sridharan
- Kevin N. Walker
- Patrick Sauer
- Gavin V. Wheeler
- Hakim Bendada
- Jaewon Sung
- Jia-Hong Lee
- Martin G. Roberts
- Xiaoyan Wang
- Jingying Chen
- Tetsunori Kobayashi
Venues
- CoRR
- BMVC
- ICCV
- ICIP
- FG
- IEEE Trans. Image Process.
- Int. J. Comput. Vis.
- CVPR
- CVPR Workshops
- Pattern Recognit.
- FGR
- Image Vis. Comput.
- Neurocomputing
- SMC
- IPMI
- VISAPP (1)
- Vis. Comput.
- Knowl. Based Syst.
- Medical Imaging: Image Processing
- IEEE Trans. Affect. Comput.
- AAAI
- IEEE Access
- VISIGRAPP (5: VISAPP)
- VISAPP (2)
- IEEE Trans. Pattern Anal. Mach. Intell.
- IROS
- AVSS
- MIRAGE
- Neural Process. Lett.
- Arch. Mus. Informatics
- ICDM
- Bildverarbeitung für die Medizin
- IEEE Trans. Inf. Forensics Secur.
- Comput. Vis. Image Underst.
- WACV
- EUSIPCO
- IEEE Trans. Knowl. Data Eng.
- ICASSP
- SITIS
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