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Zheyang Zheng
ORCID
Publication Activity (10 Years)
Years Active: 2019-2024
Publications (10 Years): 7
Top Topics
Mixed Mode
Nano Scale
Short Circuit
Reliability Analysis
Top Venues
IEEE Trans. Ind. Electron.
ASICON
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Publications
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Jiahui Sun
,
Zheyang Zheng
,
Li Zhang
,
Kevin J. Chen
Characteristics and Evaluation Approaches of Human-Body-Model Electrostatic Discharge Across Schottky p-GaN Gate HEMTs.
IEEE Trans. Ind. Electron.
71 (3) (2024)
Han Xu
,
Gaofei Tang
,
Jin Wei
,
Zheyang Zheng
,
Kevin J. Chen
Monolithic Integration of Gate Driver and Protection Modules With P-GaN Gate Power HEMTs.
IEEE Trans. Ind. Electron.
69 (7) (2022)
Jiahui Sun
,
Kailun Zhong
,
Zheyang Zheng
,
Gang Lyu
,
Kevin J. Chen
Short-Circuit Failure Mechanisms of 650-V GaN/SiC Cascode Devices in Comparison With SiC MOSFETs.
IEEE Trans. Ind. Electron.
69 (7) (2022)
Mengyuan Hua
,
Junting Chen
,
Chengcai Wang
,
Lingling Li
,
Ling Liu
,
Zheyang Zheng
,
Kevin J. Chen
E-mode p-FET-bridge HEMT: Toward high VTH, low reverse-conduction loss and enhanced stability.
ASICON
(2021)
Jiahui Sun
,
Jin Wei
,
Zheyang Zheng
,
Kevin J. Chen
Short Circuit Capability Characterization and Analysis of p-GaN Gate High-Electron-Mobility Transistors Under Single and Repetitive Tests.
IEEE Trans. Ind. Electron.
68 (9) (2021)
Yuru Wang
,
Gang Lyu
,
Jin Wei
,
Zheyang Zheng
,
Jiabei He
,
Jiacheng Lei
,
Kevin J. Chen
Characterization of Static and Dynamic Behavior of 1200 V Normally off GaN/SiC Cascode Devices.
IEEE Trans. Ind. Electron.
67 (12) (2020)
Mengyuan Hua
,
Song Yang
,
Jin Wei
,
Zheyang Zheng
,
Jiabei He
,
Kevin J. Chen
Reverse-Bias Stability and Reliability of Enhancement-mode GaN-based MIS-FET.
ASICON
(2019)