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Short Circuit Capability Characterization and Analysis of p-GaN Gate High-Electron-Mobility Transistors Under Single and Repetitive Tests.

Jiahui SunJin WeiZheyang ZhengKevin J. Chen
Published in: IEEE Trans. Ind. Electron. (2021)
Keyphrases
  • evolutionary algorithm
  • short circuit
  • image processing
  • control system
  • data management
  • experimental data