Yuri Sneyders

Publication Activity (10 Years)

Years Active: 2001-2001
Publications (10 Years): 0

Publications

Zhenqiu Ning, Yuri Sneyders, Wim Vanderbauwhede, Renaud Gillon, Marnix Tack, Paul Raes
A compact test structure for characterisation of leakage currents in sub-micron CMOS technologies. Microelectron. Reliab. 41 (12) (2001)