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Yongseok Ahn
Publication Activity (10 Years)
Years Active: 2002-2002
Publications (10 Years): 0
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Publications
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Yongseok Ahn
,
Sanghyun Lee
,
Gwanhyeob Koh
,
Taeyoung Chung
,
Kinam Kim
The abnormality in gate oxide failure induced by stress-enhanced diffusion of polycrystalline silicon.
Microelectron. Reliab.
42 (3) (2002)