W. Dauksher

Publication Activity (10 Years)

Years Active: 2003-2006
Publications (10 Years): 0

Publications

W. Dauksher, P. Marcoux, G. Castleman
A methodology for the calculation of stress migration in die-level interconnects. Microelectron. Reliab. 46 (2-4) (2006)
W. Dauksher, W. S. Burton
An examination of the applicability of the DNP metric on first level reliability assessments in underfilled electronic packages. Microelectron. Reliab. 43 (12) (2003)