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An examination of the applicability of the DNP metric on first level reliability assessments in underfilled electronic packages.

W. DauksherW. S. Burton
Published in: Microelectron. Reliab. (2003)
Keyphrases
  • higher level
  • distance measure
  • levels of abstraction
  • high level
  • lower level
  • real time
  • real world
  • computer vision
  • metadata
  • website
  • information technology
  • pairwise
  • low level
  • dimensionality reduction
  • confidence levels