Takahisa Yamaha

Publication Activity (10 Years)

Years Active: 2007-2007
Publications (10 Years): 0

Publications

Rihito Kuroda, Akinobu Teramoto, Kazufumi Watanabe, Michihiko Mifuji, Takahisa Yamaha, Shigetoshi Sugawa, Tadahiro Ohmi
Circuit level prediction of device performance degradation due to negative bias temperature stress. Microelectron. Reliab. 47 (6) (2007)