S. Y. Yeh

Publication Activity (10 Years)

Years Active: 2008-2008
Publications (10 Years): 0

Publications

Y. T. Chiang, Y. K. Fang, Y. J. Huang, T. H. Chou, S. Y. Yeh, C. S. Lin
Effect of the pre-gate oxide cleaning temperature on the reliability of GOI and devices performances in deep submicron CMOS technology. Microelectron. Reliab. 48 (11-12) (2008)