Ryozou Yoshino

Publication Activity (10 Years)

Years Active: 1985-1995
Publications (10 Years): 0

Publications

Shuji Kikuchi, Yoshihiko Hayashi, Takashi Suga, Jun Saitou, Masahiko Kaneko, Takashi Matsumoto, Ryozou Yoshino
A Gate-Array-Based 666MHz VLSI Test System. ITC (1995)
Shuji Kikuchi, Yoshihiko Hayashi, Takashi Matsumoto, Ryozou Yoshino, Ryuichi Takagi
A 250 MHz Shared-Resource VLSI Test System with High Pin Count and Memory Test Capability. ITC (1989)
Ryozou Yoshino, Ryuichi Takagi
Custom VLSI Test System. ITC (1985)