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A 250 MHz Shared-Resource VLSI Test System with High Pin Count and Memory Test Capability.

Shuji KikuchiYoshihiko HayashiTakashi MatsumotoRyozou YoshinoRyuichi Takagi
Published in: ITC (1989)
Keyphrases
  • wide range
  • multiscale
  • computing power
  • vlsi circuits
  • high speed
  • main memory
  • information resources
  • resource management
  • distributed shared memory