P. L. Liao

Publication Activity (10 Years)

Years Active: 2010-2010
Publications (10 Years): 0

Publications

H. W. Tseng, C. T. Lu, Y. H. Hsiao, P. L. Liao, Y. C. Chuang, T. Y. Chung, C. Y. Liu
Electromigration-induced failures at Cu/Sn/Cu flip-chip joint interfaces. Microelectron. Reliab. 50 (8) (2010)