O. Lazar

Publication Activity (10 Years)

Years Active: 2015-2017
Publications (10 Years): 2

Top Topics

Structuring Elements

Top Venues

Microelectron. Reliab.

Publications

Jean-Guy Tartarin, O. Lazar, D. Saugnon, Benoit Lambert, C. Moreau, C. Bouexière, E. Romain-Latu, K. Rousseau, A. David, J.-L. Roux
Gate defects analysis in AlGaN/GaN devices by mean of accurate extraction of the Schottky Barrier Height, electrical modelling, T-CAD simulations and TEM imaging. Microelectron. Reliab. (2017)
O. Lazar, Jean-Guy Tartarin, Benoit Lambert, C. Moreau, J.-L. Roux
Correlation between transient evolutions of the gate and drain currents in AlGaN/GaN technologies. Microelectron. Reliab. 55 (9-10) (2015)