N. H. Yeung

Publication Activity (10 Years)

Years Active: 2003-2004
Publications (10 Years): 0

Publications

N. H. Yeung, Victor Lau, Y. C. Chan
Bias-HAST on tape ball grid array (TBGA) test pattern. Microelectron. Reliab. 44 (4) (2004)
C. W. Tan, Y. C. Chan, N. H. Yeung
Behaviour of anisotropic conductive joints under mechanical loading. Microelectron. Reliab. 43 (3) (2003)
C. W. Tan, Y. C. Chan, N. H. Yeung
Effect of autoclave test on anisotropic conductive joints. Microelectron. Reliab. 43 (2) (2003)