N. Bicaïs-Lépinay

Publication Activity (10 Years)

Years Active: 2002-2006
Publications (10 Years): 0

Publications

S. Courtas, M. Grégoire, X. Federspiel, N. Bicaïs-Lépinay, C. Wyon
Electron BackScattered Diffraction (EBSD) use and applications in newest technologies development. Microelectron. Reliab. 46 (9-11) (2006)
N. Bicaïs-Lépinay, F. André, R. Pantel, S. Jullian, Alain Margain, L. F. Tz. Kwakman
Lift-out techniques coupled with advanced TEM characterization methods for electrical failure analysis. Microelectron. Reliab. 42 (9-11) (2002)