Michael W. Ruprecht

Publication Activity (10 Years)

Years Active: 2002-2003
Publications (10 Years): 0

Publications

Michael W. Ruprecht, Guenther Benstetter, Douglas B. Hunt
A review of ULSI failure analysis techniques for DRAMs. Part II: Defect isolation and visualization. Microelectron. Reliab. 43 (1) (2003)
Guenther Benstetter, Michael W. Ruprecht, Douglas B. Hunt
A review of ULSI failure analysis techniques for DRAMs 1. Defect localization and verification. Microelectron. Reliab. 42 (3) (2002)