Md. Adnan Zaman

Publication Activity (10 Years)

Years Active: 2017-2022
Publications (10 Years): 11

Top Topics

Design Space Exploration

Edge Detection Algorithm

Top Venues

Publications

Rajeev Joshi, Md. Adnan Zaman, Srinivas Katkoori
Fast Sobel Edge Detection for IoT Edge Devices. SN Comput. Sci. 3 (4) (2022)
Sandeep Miryala, Md. Adnan Zaman, Sandeep Mittal, Yihui Ren, Grzegorz Deptuch, Gabriella Carini, Sioan Zohar, Shinjae Yoo, Jack Fried, Jin Huang, Srinivas Katkoori
Peak Prediction Using Multi Layer Perceptron (MLP) for Edge Computing ASICs Targeting Scientific Applications. ISQED (2022)
Md. Adnan Zaman, Rajeev Joshi, Srinivas Katkoori
Early Design Space Exploration Framework for Memristive Crossbar Arrays. ACM J. Emerg. Technol. Comput. Syst. 18 (2) (2022)
Brooks Olney, Shakil Mahmud, Md. Adnan Zaman, Robert Karam
An EDA Framework for Design Space Exploration of On-Chip AI in Bioimplantable Applications. MWSCAS (2022)
Sandeep Miryala, Gabriella Carini, Grzegorz Deptuch, Jin Huang, Srinivas Katkoori, Piotr Maj, Soumyajit Mandal, Yihui Ren, Md. Adnan Zaman
Design and Challenges of Edge Computing ASICs on Front-End Electronics. ISQED (2022)
Rajeev Joshi, Md. Adnan Zaman, Srinivas Katkoori
Novel Bit-Sliced Near-Memory Computing Based VLSI Architecture for Fast Sobel Edge Detection in IoT Edge Devices. iSES (2020)
Md. Adnan Zaman, Rajeev Joshi, Srinivas Katkoori
High Level Modeling of Memristive Crossbar Arrays. ISVLSI (2020)
Md. Adnan Zaman, Rajeev Joshi, Srinivas Katkoori
Analysis of Radiation Impact on Memristive Crossbar Arrays. LASCAS (2020)
Md. Adnan Zaman, Rajeev Joshi, Srinivas Katkoori
Optimizing Performance and Energy Overheads Due to Fanout in In-Memory Computing Systems. VLSI-SoC (Selected Papers) (2018)
Md. Adnan Zaman, Srinivas Katkoori
Minimizing Performance and Energy Overheads Due to Fanout In Memristor based Logic Implementations. VLSI-SoC (2018)
Selahattin Sayil, Archit H. Shah, Md. Adnan Zaman, Mohammad A. Islam
Soft Error Mitigation Using Transmission Gate With Varying Gate and Body Bias. IEEE Des. Test 34 (1) (2017)