Masaki Kohno

Publication Activity (10 Years)

Years Active: 1999-2001
Publications (10 Years): 0

Publications

Yasuo Sato, Masaki Kohno, Toshio Ikeda, Iwao Yamazaki, Masato Hamamoto
An evaluation of defect-oriented test: WELL-controlled low voltage test. ITC (2001)
Shigeru Nakahara, Keiichi Higeta, Masaki Kohno, Toshiaki Kawamura, Keizo Kakitani
Built-in self-test for GHz embedded SRAMs using flexible pattern generator and new repair algorithm. ITC (1999)