Built-in self-test for GHz embedded SRAMs using flexible pattern generator and new repair algorithm.
Shigeru NakaharaKeiichi HigetaMasaki KohnoToshiaki KawamuraKeizo KakitaniPublished in: ITC (1999)
Keyphrases
- cost function
- preprocessing
- computational cost
- dynamic programming
- learning algorithm
- objective function
- times faster
- high speed
- high accuracy
- segmentation algorithm
- np hard
- significant improvement
- recognition algorithm
- detection algorithm
- convergence rate
- neural network
- hardware implementation
- experimental evaluation
- k means
- search space
- computational complexity
- simulated annealing
- particle swarm optimization
- active contours
- worst case
- energy function
- benchmark problems
- optimal solution