Jone F. Chen

Publication Activity (10 Years)

Years Active: 1998-2009
Publications (10 Years): 0

Publications

Jone F. Chen, Kuen-Shiuan Tian, Shiang-Yu Chen, Kuo-Ming Wu, C. M. Liu
Effect of NDD dosage on hot-carrier reliability in DMOS transistors. ISQED (2009)
Jone F. Chen, Jiang Tao, Peng Fang, Chenming Hu
Performance and reliability comparison between asymmetric and symmetric LDD devices and logic gates. IEEE J. Solid State Circuits 34 (3) (1999)
Jone F. Chen, Jiang Tao, Peng Fang, Chenming Hu
Performance and reliability of asymmetric LDD devices and logic gates. CICC (1998)
Peng Fang, Jiang Tao, Jone F. Chen, Chenming Hu
Design in hot-carrier reliability for high performance logic applications. CICC (1998)