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J. Schicker
Publication Activity (10 Years)
Years Active: 2016-2016
Publications (10 Years): 1
Top Topics
Range Data
High Density
Semiconductor Manufacturing
Tomographic Reconstruction
Top Venues
IEEE SENSORS
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Publications
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T. Arnold
,
J. Schicker
,
Martin Kraft
,
Christina Hirschl
Non-contact measurement of silicon thin wafer warpage by THz tomography and laser triangulation.
IEEE SENSORS
(2016)