J. Neil Ross

Publication Activity (10 Years)

Years Active: 2000-2007
Publications (10 Years): 0

Publications

Shu-Hui Tu, Chun-Ming Chang, J. Neil Ross, M. N. S. Swamy
Analytical Synthesis of Current-Mode High-Order Single-Ended-Input OTA and Equal-Capacitor Elliptic Filter Structures With the Minimum Number of Components. IEEE Trans. Circuits Syst. I Regul. Pap. (10) (2007)
Shu-Hui Tu, J. Neil Ross, Chun-Ming Chang
Analytical synthesis of current-mode even-Nth-order single-ended-input OTA and equal-capacitor elliptic filter structure with the minimum components. ISCAS (2006)
Shu-Hui Tu, J. Neil Ross
Low sensitivity single-ended-input OTA and grounded capacitor elliptic filter structure with the minimum components. ISCAS (1) (2005)
David Varghese, J. Neil Ross
A continuous-time hierarchical field programmable analogue array. CICC (2005)
Matthew Collins, Bashir M. Al-Hashimi, J. Neil Ross
A programmable time measurement architecture for embedded memory characterization. ETS (2005)
David Varghese, J. Neil Ross
A continuous-time hierarchical field programmable analogue array for rapid prototyping and hierarchical approach to analogue systems design. SBCCI (2005)
Peter R. Wilson, J. Neil Ross, Andrew D. Brown, Andrew J. Rushton
Multiple domain behavioral modeling using VHDL-AMS. ISCAS (5) (2004)
Peter R. Wilson, J. Neil Ross, Andrew D. Brown, Tom J. Kazmierski, Jerzy Baranowski
Efficient Mixed-Domain Behavioural Modeling of Ferromagnetic Hysteresis Implemented in VHDL-AMS. DATE (2004)
Chun-Ming Chang, Bashir M. Al-Hashimi, Yichuang Sun, J. Neil Ross
New high-order filter structures using only single-ended-input OTAs and grounded capacitors. IEEE Trans. Circuits Syst. II Express Briefs (9) (2004)
Peter R. Wilson, J. Neil Ross, Mark Zwolinski, Andrew D. Brown, Yavuz Kiliç
Behavioural Modelling of Operational Amplifier Faults Using VHDL-AMS. DATE (2002)
Don A. G. Pedder, Andrew D. Brown, J. Neil Ross, Alan Christopher Williams
A parallel-connected active filter for the reduction of supply current distortion. IEEE Trans. Ind. Electron. 47 (5) (2000)