J. H. Chuang

Publication Activity (10 Years)

Years Active: 2001-2003
Publications (10 Years): 0

Publications

Jon C. Lee, J. H. Chuang
A Novel Application of C-AFM: Deep Sub-micron Single Probing for IC Failure Analysis. Microelectron. Reliab. 43 (9-11) (2003)
Jon C. Lee, C. H. Chen, David Su, J. H. Chuang
Investigation of Sensitivity Improvement on Passive Voltage Contrast for Defect Isolation. Microelectron. Reliab. 42 (9-11) (2002)
Jon C. Lee, David Su, J. H. Chuang
A Novel Application of the FIB Lift-out Technique for 3-D TEM Analysis. Microelectron. Reliab. 41 (9-10) (2001)