A Novel Application of the FIB Lift-out Technique for 3-D TEM Analysis.

Jon C. Lee David Su J. H. Chuang

Published in: Microelectron. Reliab. (2001)

Keyphrases

image processing
data sets
real time
information systems
statistical analysis
image analysis
automatic analysis
quantitative analysis
management system
probabilistic model
user interface
trade off
data analysis
search algorithm
reinforcement learning
bayesian networks
knowledge base
decision making
machine learning