Hyeong Joon Kim

Publication Activity (10 Years)

Years Active: 2003-2003
Publications (10 Years): 0

Publications

Chihoon Lee, Donggun Park, Hyeong Joon Kim, Wonshik Lee
Electrical reliability of highly reliable 256M-bit mobile DRAM with top-edge round STI and dual gate oxide. Microelectron. Reliab. 43 (5) (2003)