H. G. Feng

Publication Activity (10 Years)

Years Active: 2001-2001
Publications (10 Years): 0

Publications

K. Gonf, H. G. Feng, R. Y. Zhan, A. Z. Wang
ESD-Induced Circuit Performance Degradation in RFICs. Microelectron. Reliab. 41 (9-10) (2001)