ESD-Induced Circuit Performance Degradation in RFICs.

K. Gonf H. G. Feng R. Y. Zhan A. Z. Wang

Published in: Microelectron. Reliab. (2001)

Keyphrases

high speed
circuit design
electronic circuits
frequency response
low voltage
real world
computer vision
information systems
case study
multiscale
search algorithm
delay insensitive