Geetani Edirisooriya

Publication Activity (10 Years)

Years Active: 1991-1996
Publications (10 Years): 0

Publications

Geetani Edirisooriya
Closed Form Aliasing Probability For Q-ary Symmetric Errors. VLSI Design 4 (3) (1996)
Samantha Edirisooriya, Geetani Edirisooriya
Diagnosis of scan path failures. VTS (1995)
Geetani Edirisooriya, John P. Robinson
Authors' reply to comments on "Aliasing Properties of Circular MISRs". J. Electron. Test. 6 (1) (1995)
Geetani Edirisooriya, Samantha Edirisooriya
Scan Chain Fault Diagnosis with Fault Dictionaries. ISCAS (1995)
Geetani Edirisooriya, Samantha Edirisooriya, John P. Robinson
On the Performance of Augmented Signature Testing. ISCAS (1993)
Geetani Edirisooriya, Samantha Edirisooriya, John P. Robinson
Time and space correlated errors in signature analysis. VTS (1993)
Geetani Edirisooriya, John P. Robinson
Test generation to minimize error masking. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 12 (4) (1993)
Geetani Edirisooriya, John P. Robinson
Aliasing properties of circular MISRs. J. Electron. Test. 4 (2) (1993)
Geetani Edirisooriya, Samantha Edirisooriya, John P. Robinson
A new built-in self-test method based on prestored testing. VTS (1993)
Geetani Edirisooriya, John P. Robinson
Design of low cost ROM based test generators. VTS (1992)
Samantha Edirisooriya, Geetani Edirisooriya
A signature efficient solution for remote file comparison. COMPSAC (1992)
Geetani Edirisooriya, John P. Robinson
Aliasing in Multiple-Valued Test Data Compaction. ISMVL (1992)
Geetani Edirisooriya, John P. Robinson
Cyclic code weight spectra and BIST aliasing. J. Electron. Test. 2 (2) (1991)
Geetani Edirisooriya, John P. Robinson
Aliasing Probability in Multiple Input Linear Signature Automata for Q-ary Symmetric Errors. ICCD (1991)