F. Bassani

Publication Activity (10 Years)

Years Active: 2013-2013
Publications (10 Years): 0

Top Topics

Atomic Force Microscopy

Evolutionary Algorithm

Top Venues

Microelectron. Reliab.

Publications

R. Foissac, S. Blonkowski, M. Kogelschatz, P. Delcroix, M. Gros-Jean, F. Bassani
Impact of bilayer character on High K gate stack dielectrics breakdown obtained by conductive atomic force microscopy. Microelectron. Reliab. 53 (12) (2013)