E. Liniger

Publication Activity (10 Years)

Years Active: 2004-2006
Publications (10 Years): 0

Publications

J. R. Lloyd, C. E. Murray, S. Ponoth, S. Cohen, E. Liniger
The effect of Cu diffusion on the TDDB behavior in a low-k interlevel dielectrics. Microelectron. Reliab. 46 (9-11) (2006)
J. R. Lloyd, M. R. Lane, X.-H. Liu, E. Liniger, T. M. Shaw, C.-K. Hu, R. Rosenberg
Reliability Challenges with Ultra-Low k Interlevel Dielectrics. Microelectron. Reliab. 44 (9-11) (2004)
J. R. Lloyd, E. Liniger, S. T. Chen
Time dependent dielectric breakdown in a low-k interlevel dielectric. Microelectron. Reliab. 44 (9-11) (2004)