Damon H. E. Tai

Publication Activity (10 Years)

Years Active: 2009-2011
Publications (10 Years): 0

Publications

Jason Chao-Hsien Pan, Damon H. E. Tai
A new strategy for defect inspection by the virtual inspection in semiconductor wafer fabrication. Comput. Ind. Eng. 60 (1) (2011)
Jason Chao-Hsien Pan, Damon H. E. Tai
Implementing virtual metrology for in-line quality control in semiconductor manufacturing. Int. J. Syst. Sci. 40 (5) (2009)