Chenfei Zhang

Publication Activity (10 Years)

Years Active: 2010-2022
Publications (10 Years): 6

Top Topics

Ad Hoc Networks

Virtual Screening

Top Venues

IEEE Trans. Veh. Technol.

Publications

Chenfei Zhang, David Hofmann, Andreas Neef, Fred Wolf
Ultrafast population coding and axo-somatic compartmentalization. PLoS Comput. Biol. 18 (1) (2022)
Shun Liu, Jianchao Zhou, Ziyan Feng, Jiawen Zhang, Shuang Li, Zilong Jin, Chenfei Zhang, Shiliang Li, Gaoqi He, Honglin Li
VRPharmer: bringing virtual reality into pharmacophore-based virtual screening with interactive exploration and realistic visualization. Bioinform. 38 (21) (2022)
Ning Zhang, Chenfei Zhang, Dengpan Wu
Construction of a smart management system for physical health based on IoT and cloud computing with big data. Comput. Commun. 179 (2021)
Yizhen Ge, Lei Lei, Lijuan Zhang, Zhilin Li, Shengsuo Cai, Chenfei Zhang
Modeling the Impact of Heterogeneous Transmission Powers on the Throughput of IEEE 802.11 Multi-Hop Ad Hoc Networks. IEEE Access 7 (2019)
Hongwei Li, Lili Ju, Chenfei Zhang, Qiujin Peng
Unconditionally Energy Stable Linear Schemes for the Diffuse Interface Model with Peng-Robinson Equation of State. J. Sci. Comput. 75 (2) (2018)
Chenfei Zhang, Yaozu Wu, Ning Liu, Chongyang Zhang
Enhanced SURF-Based Image Matching Using Pre- and Post-processing. IFTC (2016)
Lei Lei, Ting Zhang, Liang Zhou, Xiaoming Chen, Chenfei Zhang, Cheng Luo
Estimating the Available Medium Access Bandwidth of IEEE 802.11 Ad Hoc Networks With Concurrent Transmissions. IEEE Trans. Veh. Technol. 64 (2) (2015)
Chenfei Zhang, Lei Lei, Ting Zhang
Analyzing the cumulative interfering noise in multi-hop IEEE 802.11 networks. ComComAP (2014)
Chenyue Ma, Lining Zhang, Chenfei Zhang, Xiufang Zhang, Jin He, Xing Zhang
A physical based model to predict performance degradation of FinFET accounting for interface state distribution effect due to hot carrier injection. Microelectron. Reliab. 51 (2) (2011)
Chenyue Ma, Hao Wang, Chenfei Zhang, Xiufang Zhang, Jin He, Xing Zhang
Temperature dependence of the interface state distribution due to hot carrier effect in FinFET device. Microelectron. Reliab. 50 (8) (2010)