Charles E. Radke

Publication Activity (10 Years)

Years Active: 1965-1991
Publications (10 Years): 0

Publications

David M. Wu, Charles E. Radke
Delay Test Effectiveness Evaluation of LSSD-Based VLSI Vogic Circuits. DAC (1991)
David M. Wu, Charles E. Radke, J. Paul Roth
Statistical AC Test Coverage. ITC (1986)
E. Kofi Vida-Torku, James A. Monzel, Charles E. Radke
Performance Assurance of Memories Embedded in VLSI Chips. ITC (1986)
David M. Wu, Charles E. Radke, C. C. Beh
Improve Yield and Quality Through Testability Analysis of VLSI Circuits. ITC (1984)
E. Kofi Vida-Torku, Charles E. Radke
Quality level and fault coverage for multichip modules. DAC (1983)
C. C. Beh, K. H. Arya, Charles E. Radke, E. Kofi Vida-Torku
Do Stuck Fault Models Reflect Manufacturing Defects? ITC (1982)
Charles E. Radke
The use of quadratic residue research. Commun. ACM 13 (2) (1970)
Charles E. Radke
A justification of, and an improvement on, a useful rule for predicting circuit-to-pin ratios. DAC (1969)
Charles E. Radke
Merge-Sort Analysis by Matrix Techniques. IBM Syst. J. 5 (4) (1966)
Charles E. Radke
Necessary and Sufficient Conditions on Conditional Probabilities to Maximize Entropy Inf. Control. 9 (3) (1966)
Charles E. Radke
Enumeration of Strongly Connected Sequential Machines Inf. Control. 8 (4) (1965)