C. C. Beh

Publication Activity (10 Years)

Years Active: 1982-1984
Publications (10 Years): 0

Publications

David M. Wu, Charles E. Radke, C. C. Beh
Improve Yield and Quality Through Testability Analysis of VLSI Circuits. ITC (1984)
C. C. Beh, K. H. Arya, Charles E. Radke, E. Kofi Vida-Torku
Do Stuck Fault Models Reflect Manufacturing Defects? ITC (1982)