Benoit Dubois

Publication Activity (10 Years)

Years Active: 2007-2023
Publications (10 Years): 1

Publications

Christophe Fluhr, Benoit Dubois, Guillaume Le Tetu, Valérie Soumann, Julien Paris, Enrico Rubiola, Vincent Giordano
Reliability and Reproducibility of the Cryogenic Sapphire Oscillator Technology. IEEE Trans. Instrum. Meas. 72 (2023)
Benoit Dubois, Jean-Baptiste Kammerer, Luc Hébrard, Francis Braun
Modelling of hot-carrier degradation and its application for analog design for reliability. Microelectron. J. 40 (9) (2009)
Benoit Dubois, Jean-Baptiste Kammerer, Luc Hébrard, Francis Braun
Analytical Modeling of Hot-Carrier Induced Degradation of MOS Transistor for Analog Design for Reliability. ISQED (2007)