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Modelling of hot-carrier degradation and its application for analog design for reliability.
Benoit Dubois
Jean-Baptiste Kammerer
Luc Hébrard
Francis Braun
Published in:
Microelectron. J. (2009)
Keyphrases
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user interface
design decisions
machine learning
case study
design process
design tools
real time
genetic algorithm
decision trees
bayesian networks
software architecture
embedded systems
circuit design