EMC Compo

Publications

2015

Jaemin Lim, Manho Lee, Daniel H. Jung, Jonghoon J. Kim, Sumin Choi, Hyunsuk Lee, Joungho Kim
Shielding structures for through silicon via (TSV) to active circuit noise coupling in 3D IC. EMC Compo (2015)
Alexis Schindler, Benno Koeppl, Bernhard Wicht
EMC and switching loss improvement for fast switching power stages by di/dt, dv/dt optimization with 10ns variable current source gate driver. EMC Compo (2015)
Jonghoon J. Kim, Daniel H. Jung, Heegon Kim, Sunkyu Kong, Sumin Choi, Jaemin Lim, Joungho Kim
TSV-based current probing structure using magnetic coupling in 2.5D and 3D IC. EMC Compo (2015)
Andreas Rauchenecker, Timm Ostermann
Examination of different adder structures concerning di/dt in a 180nm technology. EMC Compo (2015)
Christofer de Oliveira, Leticia Bolzani Poehls, Fabian Vargas
On-chip Watchdog to monitor RTOS activity in MPSoC exposed to noisy environment. EMC Compo (2015)
Jongtae Hwang, Youngbong Han, Hyunho Park, Wansoo Nah, Soyoung Kim
Radiated electromagnetic immunity analysis of VCO using IC stripline method. EMC Compo (2015)
Mart Coenen, Ming Ye, Huichun Yu
Dynamic multi-parameter response model for SEED analysis. EMC Compo (2015)
Etienne Sicard, Alexandre Boyer, Priscila Fernandez-Lopez, An Zhou, Nicolas Marier, Frédéric Lafon
EMC performance analysis of a processor/memory system using PCB and Package-On-Package. EMC Compo (2015)
Ahmed Aldabbagh, Alistair Duffy
Ageing effects on power RF LDMOS reliability using the Transmission Line Matrix method. EMC Compo (2015)
H. Herrmann, W. Horchler, S. Schwarz, Philipp Schröter, Frank Klotz, M. Brignone, Franco Fiori
Smart power IC macromodeling for DPI analysis. EMC Compo (2015)
Sergey Miropolsky, Stefan Jahn, Frank Klotz, Stephan Frei
Experimental validation of the generalized accurate modelling method for system-level bulk current injection setups up to 1 GHz. EMC Compo (2015)
Shih-Yi Yuan, Ting-Wei Yeh, Yung-Chi Tang, Chiu-Kuo Chen
Time-domain EMI measurement methodology. EMC Compo (2015)
Jean-Marc Dienot, Emmanuel Batista, Ioav Ramos
Thermal-electromagnetic susceptibility behaviors of PWM patterns used in control electronic circuit. EMC Compo (2015)
Sergei Kapora, Marcel Hanssen, Jan Niehof, Quino Sandifort
Methodology for interference analysis during early design stages of high-performance mixed-signal ICs. EMC Compo (2015)
Megumi Saito, Takaaki Mizuki, Hideaki Sone, Yu-ichi Hayashi
Fundamental study on randomized processing in cryptographic IC using variable clock against Correlation Power Analysis. EMC Compo (2015)
Adrien Doridant, Jeremy Raoult, Sylvie Jarrix, Jean-Jacques Laurin, Patrick Hoffmann
Preliminary study of Automatic Control Gain loop subjected to pulse-modulated radiofrequency interference. EMC Compo (2015)
Mohammed Amellall, Sjoerd Op't Land, Richard Perdriau, Mohammed Ramdani, Ali Ahaitouf, M'hamed Drissi
Direct power injection on functional and non-functional signals of SPI EEPROM memories. EMC Compo (2015)
SangHyeok Park, Hai Au Huynh, SoYoung Kim
Analysis of EMI reduction methods of DC-DC buck converter. EMC Compo (2015)
M. Burak Baran, Wim Dehaene, Hugo Pues, Kristof Stijnen
Case study on the differences between EMI resilience of analog ICs against continuous wave, modulated and transient disturbances. EMC Compo (2015)
Priscila Fernandez-Lopez, M. Amara, T. Q. V. Hoang, Frédéric Lafon
DPI set-up for ICs with differential inputs. EMC Compo (2015)
Mario Rotigni, Mauro Merlo, Martina Cordoni, Paolo Colombo, Valentino Liberali
Role of IC substrate and ESD protections in noise propagation: Design and modelling of dedicated test chip in 40 nm technology. EMC Compo (2015)
Welcome to EMC Compo 2015. EMC Compo (2015)
Hidetoshi Miyahara, Nobuaki Ikehara, Tohlu Matsushima, Takashi Hisakado, Osami Wada
Relation between internal terminal voltage and immunity behavior of LDO regulator circuits. EMC Compo (2015)
Bertrand Vrignon, A. Doridant, K. Abouda, Y. Gao, D. Pagnoux, T. Marek
Near-field injection on a Safe System Basis Chip at silicon level. EMC Compo (2015)
Matthieu Deloge, Arnoud P. van der Wel, Shishir Goyal, Gerald Kwakernaat, Adrien Schoof
A highly-digitized automotive CAN transceiver in 0.14µm high-voltage SOI CMOS. EMC Compo (2015)
Boyuan Zhu, Junwei Lu, Mingcheng Zhu, Mei Jiang
Arbitrary shape multilayer interconnects EMC modelling and optimization. EMC Compo (2015)
Yann Bacher, Nicolas Froidevaux, Philippe Dupre, Henri Braquet, Gilles Jacquemod
Resonance analysis for EMC improvement in integrated circuits. EMC Compo (2015)
Tvrtko Mandic, Raul Blecic, Renaud Gillon, Adrijan Baric
DC/DC converter dead-time variation analysis and far-field radiation estimation. EMC Compo (2015)
Jeremy Raoult, Pierre Payet, Rachid Omarouayache, Laurent Chusseau
Electromagnetic coupling circuit model of a magnetic near-field probe to a microstrip line. EMC Compo (2015)
Philipp Schröter, Frank Klotz, Marco Pamato
RF immunity investigations of linear DC current regulators. EMC Compo (2015)
Bernd Deutschmann, Gunter Winkler, Timuçin Karaca
Emission reduction in Class D audio amplifiers by optimizing spread spectrum modulation. EMC Compo (2015)
Andrea Lavarda, Dominik Amschl, Susanne Bauer, Bernd Deutschmann
Characterization of the immunity of integrated circuits (ICs) at wafer level. EMC Compo (2015)
Boyuan Zhu, Junwei Lu, Ling Sun, Haiyan Sun
Computational electromagnetics in shielding analysis of system in package. EMC Compo (2015)
Thomas Ungru, Wolfgang Wilkening, Steffen Walker, Renato Negra
Functional analysis of an integrated communication interface during ESD. EMC Compo (2015)
V. Tomasevic, Alexandre Boyer, Sonia Ben Dhia
Bandgap failure study due to parasitic bipolar substrate coupling in Smart Power mixed ICs. EMC Compo (2015)
Andy Degraeve, Davy Pissoort, Keith Armstrong
Improving the shielding effectiveness of a board-level shield by bonding it with the waveguide-below-cutoff principle. EMC Compo (2015)
Satoshi Tanaka, Peng Fan, Jingyan Ma, Hanae Aoki, Masahiro Yamaguchi, Makoto Nagata, Sho Muroga
Analysis of on-chip digital noise coupling path for wireless communication IC test chip. EMC Compo (2015)
Lars Glaesser, Sven Koenig
ESD test at component level. EMC Compo (2015)
Johannes Gert Janschitz
An EMI robust LIN driver with low electromagnetic emission. EMC Compo (2015)
10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2015, Edinburgh, UK, November 10-13, 2015 EMC Compo (2015)
Marko Magerl, Christian Stockreiter, Oliver Eisenberger, Rainer Minixhofer, Adrijan Baric
Building interchangeable black-box models of integrated circuits for EMC simulations. EMC Compo (2015)
Kamel Abouda, Guillaume Aulagnier, Eric Rolland, Marc Cousineau
Analytical approach to study Electromagnetic emission EME contributors on DC/DC applications. EMC Compo (2015)
Philipp Schröter, Fabio Ballarin, Franco Fiori
Susceptibility to EMI of high side current sensors based on chopper OpAmps. EMC Compo (2015)
Herbert Hackl, Gunter Winkler, Bernd Deutschmann
Simulation of radiated emission during the design phase based on scattering parameter measurement. EMC Compo (2015)
Abhishek Ramanujan, Etienne Sicard, Alexandre Boyer, Jean-Luc Levant, Christian Marot, Frédéric Lafon
Developing a universal exchange format for Integrated Circuit Emission Model - Conducted Emissions. EMC Compo (2015)
Alexandre Boyer, M. Cavarroc
Enhancement of the spatial resolution of near-field immunity maps. EMC Compo (2015)
Hyun Ho Park, Dong Gun Kam, Young-Bae Park, Jiseong Kim, Jae-Deok Lim, Hark-Byeong Park, Eakhwan Song
RF interference evaluation of flexible flat cables for high-speed data transmission in mobile devices. EMC Compo (2015)
Raul Blecic, Renaud Gillon, Bart Nauwelaers, Adrijan Baric
Radiation characteristics of small loop antenna above perforated finite image plane. EMC Compo (2015)
Andrea Lavarda, Bernd Deutschmann
EMI improved chopped operational amplifier. EMC Compo (2015)
C. Pouant, J. Raoult, P. Hoffmann
Large domain validity of MOSFET microwave-rectification response. EMC Compo (2015)