ITC-Asia

Publications

2023

Wei-Ji Chao, Tong-Yu Hsieh
Cost-Effective Error-Mitigation for High Memory Error Rate of DNN: A Case Study on YOLOv4. ITC-Asia (2023)
Hao Cheng, Chi-Jhe Li, Hung-Lin Chen, Jiun-Lang Huang
BDD-Based Self-Test Program Generation for Processor Cores. ITC-Asia (2023)
Janet Olson
Test industry challenges and solutions as observed by the leading physical implementation solution provider : Invited Talk 2. ITC-Asia (2023)
Mohd Amiruddin Zainol, Sompon Khamron, Ng Gua Bin
Optimizing Post-Silicon Validation for FPGA Serial Configuration using an Automation Framework and Timing Characterization Verification. ITC-Asia (2023)
Shintaro Yamamichi
Technology for The Future of Computing : Keynote 2. ITC-Asia (2023)
Bin Zhang, Ye Cai, Zhiheng He, Sen Liang, Wei He
Structured DFT Development Approach for Chisel-Based High Performance RISC-V Processors. ITC-Asia (2023)
Aibin Yan, Jing Xiang, Zhengfeng Huang, Tianming Ni, Jie Cui, Patrick Girard, Xiaoqing Wen
Design of A Highly Reliable and Low-Power SRAM With Double-Node Upset Recovery for Safety-critical Applications. ITC-Asia (2023)
David C. Keezer, Dany Minier, Hongjie Li
Experimental Evaluation of Jitter Reduction Methods for Multi-Gigahertz Test. ITC-Asia (2023)
Yi-Hsuan Lee, Wei-Hao Chen, Shi-Yu Huang
Self-Sufficient Clock Jitter Measurement Methodology Using Dithering-Based Calibration. ITC-Asia (2023)
IEEE International Test Conference in Asia, ITC-Asia 2023, Matsue, Japan, September 12-14, 2023 ITC-Asia (2023)
Lee Harrison, Wu Yang
Scalable hierarchical DFT technologies for AI, SOC and multi-die : Tutorial 1. ITC-Asia (2023)
Hao-Chiao Hong, Chien-Hung Chen, Yu-Wun Chen
Parametric Faults in Computing-in-Memory Applications of a 4kb Read-Decoupled 8T SRAM Array in 40nm CMOS. ITC-Asia (2023)
Aibin Yan, Fan Xia, Tianming Ni, Jie Cui, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen
A Low Overhead and Double-Node-Upset Self-Recoverable Latch. ITC-Asia (2023)
Meng-Shan Wu, Yen-Lin Chua, Jin-Fu Li, Yun-Ting Chuan, Shih-Hsu Huang
Fault-Aware ECC Scheme for Enhancing the Read Reliability of STT-MRAMs. ITC-Asia (2023)
Yasumitsu Orii
Semiconductor Packaging Revolution in the Era of Chiplets : Keynote 1. ITC-Asia (2023)
Yervant Zorian
Silicon Lifecycle Management: Trends, Challenges and Solutions : Tutorial 2. ITC-Asia (2023)
Po-Yao Chuang, Francesco Lorenzelli, Erik Jan Marinissen
Generating Test Patterns for Chiplet Interconnects: Achieving Optimal Effectiveness and Efficiency. ITC-Asia (2023)
Chen-Lin Tsai, Shi-Yu Huang
Trustworthy Lifetime Prediction by Aging History Analysis and Multi-Level Stress Test. ITC-Asia (2023)
Shogo Tokai, Daichi Akamatsu, Hiroyuki Yotsuyanagi, Masaki Hashizume
On Test Pattern Generation Method for an Approximate Multiplier Considering Acceptable Faults. ITC-Asia (2023)
Erik Jan Marinissen
Moore Meets Murphy : Invited Talk 1. ITC-Asia (2023)
Kentaroh Katoh, Shuhei Yamamoto, Zheming Zhao, Yujie Zhao, Shogo Katayama, Anna Kuwana, Takayuki Nakatani, Kazumi Hatayama, Haruo Kobayashi, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa
A Physically Unclonable Function Using Time-to-Digital Converter with Linearity Self-Calibration and its FPGA Implementation. ITC-Asia (2023)
Aibin Yan, Chao Zhou, Shaojie Wei, Jie Cui, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen
Design of a Novel Latch with Quadruple-Node-Upset Recovery for Harsh Radiation Hardness. ITC-Asia (2023)
Ayano Takaya, Michihiro Shintani
Feasibility Study of Incremental Neural Network Based Test Escape Detection by Introducing Transfer Learning Technique. ITC-Asia (2023)
Shyue-Kung Lu, Xin Dong
Integrated Progressive Built-In Self-Repair (IPBISR) Techniques for NAND Flash Memory. ITC-Asia (2023)
Yuki Yamanaka, Masayuki Arai, Yoshikazu Nagamura, Satoshi Fukumoto
Toward Improvement and Evaluation of Reconstruction Capability of CapsNet-Based Wafer Map Defect Pattern Classifier. ITC-Asia (2023)
Anwesh Kumar Samal, Sandeep Kumar, Atin Mukherjee
Design of Single Node Upset Resilient Latch for Low Power, Low Cost and Highly Robust Applications. ITC-Asia (2023)
Liang Hong, Ge Zhu, Jing Zhou, Xuefei Li, Ziyi Chen, Wei Hu
Hunting for Hardware Trojan in Gate Netlist: A Stacking Ensemble Learning Perspective. ITC-Asia (2023)
Xuejian Li, Zhengguang Zhu
Software Defect Detection Based on Feature Fusion and Alias Analysis. ITC-Asia (2023)

2022

2021