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Failure and failure characterization of QFP package interconnect structure under random vibration condition.

Jiaxing HuBo JingZengjin ShengFang LuYaojun ChenYulin Zhang
Published in: Microelectron. Reliab. (2018)
Keyphrases
  • failure prediction
  • sufficient conditions
  • tree structure
  • failure rate
  • database
  • computer vision
  • fuzzy logic
  • high speed
  • network structure
  • structural information
  • failure detection