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Experts
- Katsushi Ikeuchi
- Paul E. Debevec
- Shree K. Nayar
- Ko Nishino
- Shunlin Liang
- Abhijeet Ghosh
- Takahiko Horiuchi
- Yasuyuki Matsushita
- Yoichi Sato
- Shoji Tominaga
- Imari Sato
- Eric F. Vermote
- Pieter Peers
- Jonathan T. Barron
- Zhiqiang Xiao
- Keita Hirai
- Haruo Takemura
- Ravi Ramamoorthi
- Takashi Machida
- Stephen Lin
- Pratul P. Srinivasan
- Robby T. Tan
- Donald P. Greenberg
- Maria Petrou
- Andrew Zisserman
- Graham D. Finlayson
- Shireen Y. Elhabian
- Daniel Cremers
- Marc Stamminger
- Peter N. Belhumeur
- Takashi Matsuyama
- Takahiro Okabe
- Naokazu Yokoya
- Aly A. Farag
- Brian V. Funt
- Tobias Ritschel
- Norimichi Tsumura
- Masaru Tsuchida
- Sunil Hadap
Venues
- CoRR
- IGARSS
- Remote. Sens.
- CVPR
- ACM Trans. Graph.
- ICCV
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Trans. Geosci. Remote. Sens.
- CIC
- ICIP
- SIGGRAPH Talks
- IEEE Access
- Sensors
- IAS
- Color Imaging Conference
- ICRA
- Comput. Graph. Forum
- MVA
- SIGGRAPH Posters
- IEEE Geosci. Remote. Sens. Lett.
- BMVC
- Color Imaging: Displaying, Processing, Hardcopy, and Applications
- Image Vis. Comput.
- IEEE Trans. Instrum. Meas.
- Int. J. Comput. Vis.
- ECCV (2)
- IECON
- CHI Extended Abstracts
- CVPR (1)
- IEEE Trans. Vis. Comput. Graph.
- Human Vision and Electronic Imaging
- NeuroImage
- Comput. Graph.
- SIGGRAPH Courses
- Pattern Recognit.
- ICASSP
- Comput. Vis. Image Underst.
- CVPR (2)
- Material Appearance
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