ULTRA HIGH
Experts
- Essa Yacoub
- Kamil Ugurbil
- Wietske van der Zwaag
- Jörg Felder
- Noam Harel
- Robert Turner
- N. Jon Shah
- Mingzhe Rong
- Larisa Safina
- Andreas Schäfer
- Francesco Mondada
- Federico De Martino
- Shovasis Kumar Biswas
- Peter M. Lilleboe
- Seyed Javad Azhari
- Benedikt A. Poser
- Lawrence L. Wald
- Elia Formisano
- Yutaka Miyamoto
- Kâmil Uludag
- Saverio Giallorenzo
- Takayuki Kobayashi
- Fabrizio Montesi
- Timothy York
- Tao Wang
- Calvin C. Teague
- Rainer Goebel
- Stefano Pio Zingaro
- Jian Wang
- Donald E. Barrick
- Jan Zimmermann
- Viktor Gruev
- Yi Wang
- Markus Barth
- Ruba Alsmadi
- Takashi Ito
- Gert Cauwenberghs
- Terry M. Peters
- Christopher Edmiston
Venues
- NeuroImage
- IEEE Access
- Sensors
- CoRR
- IGARSS
- OFC
- ISCAS
- Proc. IEEE
- ICTON
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Ind. Electron.
- Microelectron. J.
- Symmetry
- Remote. Sens.
- IEEE Trans. Circuits Syst. II Express Briefs
- SIAM J. Math. Anal.
- RFID-TA
- IEEE Trans. Commun.
- Entropy
- IEEE SENSORS
- IEICE Electron. Express
- IAS
- EMBC
- IEICE Trans. Electron.
- PIMRC
- IECON
- NEMS
- IEEE Trans. Veh. Technol.
- IEEE Trans. Broadcast.
- DRC
- ICRA
- ICC
- Microelectron. Reliab.
- Appl. Math. Lett.
- IEICE Trans. Commun.
- IEEE J. Solid State Circuits
- MILCOM
- ECOC
- J. Comput. Phys.
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