TOTAL ERROR RATE
Experts
- Kar-Ann Toh
- Se-In Jang
- Sheraz Ahmed
- Andreas Kölsch
- Marcus Liwicki
- Andrew Beng Jin Teoh
- Jaihie Kim
- Muhammad Zeshan Afzal
- David A. Draki
- Xiao Wei Liu
- Mattia Ricco
- Jonas Costa
- Chung-Cheng Chen
- Shaltiel Eloul
- Saeid Yazdanpanah
- Robert M. Losee
- Mark P. Hale Jr.
- Ansgar Fehnker
- John B. Kenney
- Ken-ichi Kawarabayashi
- Yingshu Li
- Hamza Soury
- Charles E. Rohrs
- Vinay Chakravarthi Gogineni
- Xiaobin Ren
- Robert Ward
- Mingyang Shi
- Mohammad Mosleh
- Sangyoun Lee
- Subrahmanyam Mula
- Xu Zhou
- Remus Teodorescu
- Kwontaeg Choi
- Amit Patra
- Chunyu Ai
- Siddhartha Mukhopadhyay
- Meng Zhang
- Jyotirmaya Sahoo
- Phillip G. Armour
Venues
- CoRR
- Pattern Recognit.
- COMPSAC
- Computer
- J. Circuits Syst. Comput.
- FLAIRS Conference
- VTC Fall
- IEEE Trans. Computers
- ISITA
- BCS HCI
- NeuroImage
- Expert Syst. Appl.
- Commun. ACM
- ICIT
- Acta Informatica
- Inf. Process. Manag.
- Autom.
- Neural Comput.
- CANS
- Symmetry
- NFM
- SODA
- NeurIPS
- IECON
- IEEE Trans. Wirel. Commun.
- SMC
- AGILE
- IEEE Trans. Syst. Man Cybern. Syst.
- ICASSP
- Ubiquity
- ICDAR
- IEEE Trans. Very Large Scale Integr. Syst.
- Discret. Math.
- WASA
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