TECHNICAL ASPECTS
Experts
- André Ivanov
- Dragos Vieru
- Madhusanka Liyanage
- Ulrika H. Westergren
- Michael B. Knight
- Margaret-Anne D. Storey
- Simeon Vidolov
- B. Dawn Medlin
- Helmut Krcmar
- Parvaneh Asghari
- Jyri Kemppainen
- Peng Liang
- Matti Tedre
- Thomas Krendl Gilbert
- David K. Vawdrey
- Elizabeth F. Churchill
- John Kornak
- Apostolos Ampatzoglou
- Wei-Yun Chiu
- André Kushniruk
- Yabing Jiang
- Azade Fotouhi
- Hamid Haj Seyyed Javadi
- Daniela E. Damian
- Irum Inayat
- Mahbub Hassan
- Hang Wang
- T. D. Wilson
- Rob Procter
- Valentina Lenarduzzi
- Victor M. van Santen
- Mika Ylianttila
- Andreas Girgensohn
- Hans-Jürgen Sebastian
- Paul Drews
- Mohamed Amine Ferrag
- Jens Heuschkel
- Shradha Verma
- Frank Maurer
Venues
- CoRR
- HICSS
- IEEE Access
- Sensors
- J. Electron. Test.
- IEEE Commun. Mag.
- ECIS
- IEEE Trans. Engineering Management
- EDUCON
- AMCIS
- IGARSS
- STAST
- AI Soc.
- ICSE
- MedInfo
- SMC
- Proc. IEEE
- Int. J. Online Biomed. Eng.
- Computer
- LREC
- Microelectron. Reliab.
- SIGDOC
- ISQED
- IEEE Commun. Surv. Tutorials
- ProComm
- ETFA
- Int. J. Online Eng.
- IEEE Softw.
- Educ. Inf. Technol.
- Gov. Inf. Q.
- J. Assoc. Inf. Sci. Technol.
- ACIT
- ESSDERC
- Libr. Hi Tech
- Int. J. Autom. Technol.
- Sci. Eng. Ethics
- SIGCSE
- ICMC
- ASP-DAC
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