TECHNICAL ASPECTS
Experts
- Dragos Vieru
- André Ivanov
- Madhusanka Liyanage
- Ulrika H. Westergren
- Margaret-Anne D. Storey
- Michael B. Knight
- Simeon Vidolov
- Jyri Kemppainen
- Matti Tedre
- Peng Liang
- Parvaneh Asghari
- B. Dawn Medlin
- Helmut Krcmar
- Salman Raza
- Valentina Lenarduzzi
- Marco Casassa Mont
- Jean-Claude Chupin
- Gürkan Gür
- Brij B. Gupta
- Patrick Peiffer
- Yujia Lin
- Joan S. Ash
- Sergei Grishunin
- Stan Kurkovsky
- Hariolf Grupp
- Anshuman Kalla
- Talita Vieira Ribeiro
- Irum Inayat
- Chien-Ching Li
- Xin Xia
- Pekka Abrahamsson
- Julie A. Kientz
- Chen Sun
- Yaser Ghanam
- Andreas Girgensohn
- Mahammad Abdul Hannan
- George Kosteletos
- Manuel Castro
- Jörg Henkel
Venues
- CoRR
- HICSS
- IEEE Access
- J. Electron. Test.
- Sensors
- IEEE Commun. Mag.
- ECIS
- IEEE Trans. Engineering Management
- EDUCON
- STAST
- IGARSS
- AMCIS
- AI Soc.
- SMC
- ICSE
- MedInfo
- Computer
- Proc. IEEE
- Int. J. Online Biomed. Eng.
- LREC
- Int. J. Online Eng.
- ISQED
- IEEE Softw.
- ProComm
- IEEE Commun. Surv. Tutorials
- Microelectron. Reliab.
- SIGDOC
- ETFA
- Int. J. Autom. Technol.
- CHI Extended Abstracts
- Libr. Hi Tech
- Int. J. Medical Informatics
- IEEE Technol. Soc. Mag.
- Electron. J. Inf. Syst. Dev. Ctries.
- EMBC
- Int. J. Technol. Manag.
- CSCW
- Sci. Eng. Ethics
- ASP-DAC
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