SURFACE REFLECTANCE
Experts
- Katsushi Ikeuchi
- Edwin R. Hancock
- Boxin Shi
- Yasuyuki Matsushita
- Ko Nishino
- Roberto Mecca
- Paul E. Debevec
- Imari Sato
- Norimichi Tsumura
- Ravi Ramamoorthi
- Todd E. Zickler
- Pieter Peers
- Shunlin Liang
- Aly A. Farag
- Roberto Cipolla
- Brian V. Funt
- Luc Van Gool
- Melvyn L. Smith
- Yoichi Miyake
- Mark S. Drew
- Michael Breuß
- Takahiro Okabe
- Eric F. Vermote
- Yvain Quéau
- Shree K. Nayar
- Ruigang Yang
- Yoichi Sato
- Maria Petrou
- Hossein Ragheb
- Ping Tan
- William A. P. Smith
- Daisuke Miyazaki
- David J. Kriegman
- Yuji Iwahori
- Koichiro Deguchi
- Graham D. Finlayson
- Philip L. Worthington
- Jean-Denis Durou
- Alfred M. Bruckstein
Venues
- CoRR
- CVPR
- Remote. Sens.
- IGARSS
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICCV
- IEEE Trans. Geosci. Remote. Sens.
- ICIP
- ACM Trans. Graph.
- Sensors
- Color Imaging Conference
- Int. J. Comput. Vis.
- BMVC
- Comput. Vis. Image Underst.
- MVA
- IEEE Access
- 3DV
- CIC
- Comput. Graph. Forum
- IEEE Trans. Image Process.
- Pattern Recognit. Lett.
- CGIV
- EMBC
- ICRA
- Systems and Computers in Japan
- ICPR
- ICCP
- J. Electronic Imaging
- Mach. Vis. Appl.
- IEEE Geosci. Remote. Sens. Lett.
- Color Imaging: Processing, Hardcopy, and Applications
- Color Imaging: Displaying, Processing, Hardcopy, and Applications
- IEEE Trans. Vis. Comput. Graph.
- CVPR (1)
- ECCV (2)
- WACV
- Int. J. Appl. Earth Obs. Geoinformation
- SIGGRAPH Posters
- Rendering Techniques
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