SILICON DIOXIDE
Experts
- Hei Wong
- Dennis Sylvester
- Volkan Kursun
- David T. Blaauw
- Hiroshi Iwai
- George J. Papaioannou
- Kuniyuki Kakushima
- Gaudenzio Meneghesso
- Eddy Simoen
- Jijun Xiong
- Giuseppe Currò
- Cor Claeys
- Giovanni De Micheli
- Chi-Wah Kok
- Matteo Meneghini
- Paul E. Hasler
- Matroni Koutsoureli
- Masahiro Fujita
- Yikai Su
- M. C. Poon
- Enrico Zanoni
- Shunpei Yamazaki
- Mohamad Sawan
- Saibal Mukhopadhyay
- Ahmad Hassan
- Amir Nahir
- Tibor Grasser
- Pierre-Emmanuel Gaillardon
- P. T. Lai
- James W. Tschanz
- Nagarajan Raghavan
- Jean Marc Gallière
- Bin Zhang
- Michel Renovell
- Kun-Shan Chen
- Gunther Roelkens
- Avi Ziv
- Xavier Aymerich
- Montserrat Nafría
Venues
- Microelectron. Reliab.
- Sensors
- IEEE Access
- Microelectron. J.
- OFC
- IRPS
- NEMS
- IEICE Trans. Electron.
- IEEE Trans. Instrum. Meas.
- IEICE Electron. Express
- ISCAS
- CoRR
- ESSDERC
- IEEE Trans. Ind. Electron.
- IEEE J. Solid State Circuits
- DAC
- Proc. IEEE
- IEEE SENSORS
- ICTON
- VLSI Design
- ICECS
- DRC
- IEEE Trans. Circuits Syst. II Express Briefs
- IBM J. Res. Dev.
- CICC
- IGARSS
- IEEE Trans. Very Large Scale Integr. Syst.
- IET Circuits Devices Syst.
- SIAM J. Appl. Math.
- CCE
- Displays
- IECON
- ASICON
- 3DIC
- IAS
- EMBC
- DATE
- IEEE Trans. Geosci. Remote. Sens.
- ISQED
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