SCAN LINE
Experts
- Shin'ichiro Okazaki
- Nobuyuki Yamashita
- Stanislav G. Sedukhin
- Yoshihiro Fujita
- Ismail Ababneh
- Fumiaki Tomita
- Yasushi Sumi
- Saad Bani-Mohammad
- Dan I. Moldovan
- Peter Willett
- Nelson Morgan
- Sun-Yuan Kung
- Ahmed Sherif Zekri
- Manfred Kunde
- Viktor K. Prasanna
- Myung Hoon Sunwoo
- Narayanan Vijaykrishnan
- James Beck
- Mladen Berekovic
- Stephen James
- Yoshi Sugiyama
- Chang-Sung Jeong
- Yoshihiro Kawai
- Alberto Ferrari
- Junxian He
- Mohamed Ould-Khaoua
- Oscar H. Ibarra
- Xiaoyan Xie
- Jie Tian
- Maurice Clint
- Isaac D. Scherson
- J. Andrew Holey
- Hussein M. Alnuweiri
- Alan L. Yuille
- Konstantinos G. Margaritis
- David T. Blaauw
- Hun-Seok Kim
- Arjuna Madanayake
- Toshio Kondo
Venues
- CoRR
- ICASSP
- J. Parallel Distributed Comput.
- CVPR
- IEEE Trans. Computers
- ASAP
- IEEE Access
- IEEE Trans. Pattern Anal. Mach. Intell.
- ISCA
- ISCAS
- ICRA
- Parallel Comput.
- Sensors
- IEEE J. Solid State Circuits
- Inf. Process. Lett.
- IEEE Trans. Circuits Syst. Video Technol.
- IJCNN
- ICPP (3)
- SIGGRAPH
- CVPR Workshops
- IJCAI
- Systems and Computers in Japan
- CONPAR
- ICIP
- Remote. Sens.
- ICCD
- J. VLSI Signal Process.
- ICPP
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- Pattern Recognit.
- IEEE Trans. Circuits Syst. I Regul. Pap.
- IEEE Computer Graphics and Applications
- Computer
- Microprocess. Microprogramming
- WACV
- Neurocomputing
- Eurographics
- ICPR
- Comput. Graph. Forum
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