SCAN LINE
Experts
- Shin'ichiro Okazaki
- Nobuyuki Yamashita
- Stanislav G. Sedukhin
- Yoshihiro Fujita
- Ismail Ababneh
- Yasushi Sumi
- Dan I. Moldovan
- Fumiaki Tomita
- Saad Bani-Mohammad
- Peter Willett
- Manfred Kunde
- Mladen Berekovic
- Sun-Yuan Kung
- James Beck
- Nelson Morgan
- Yoshi Sugiyama
- Stephen James
- Chang-Sung Jeong
- Yoshihiro Kawai
- Myung Hoon Sunwoo
- Ahmed Sherif Zekri
- Narayanan Vijaykrishnan
- Viktor K. Prasanna
- Hussein M. Alnuweiri
- Hongchi Shi
- N. Bhavanishankar
- Ángel Rodríguez-Vázquez
- Danny Krizanc
- Hun-Seok Kim
- Oscar H. Ibarra
- Ari Paasio
- Itsuo Takanami
- Mohamed Ould-Khaoua
- Panagiotis D. Michailidis
- N. Ranganathan
- Rongrong Ji
- Tom Vander Aa
- Phil Kohn
- Xiaoyan Xie
Venues
- CoRR
- ICASSP
- IEEE Trans. Computers
- ASAP
- J. Parallel Distributed Comput.
- CVPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Access
- ISCAS
- ISCA
- Sensors
- IEEE J. Solid State Circuits
- ICRA
- Parallel Comput.
- SIGGRAPH
- ICPP (3)
- IJCNN
- Inf. Process. Lett.
- IEEE Trans. Circuits Syst. Video Technol.
- Systems and Computers in Japan
- CONPAR
- CVPR Workshops
- IJCAI
- ICIP
- Pattern Recognit.
- IEEE Computer Graphics and Applications
- IEEE Trans. Circuits Syst. I Regul. Pap.
- ICCD
- ICPP
- J. VLSI Signal Process.
- Remote. Sens.
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- Comput. Graph. Forum
- Microprocess. Microsystems
- Neurocomputing
- ICDAR
- Eur. J. Oper. Res.
- CICC
- SIGIR
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