SCALE INVARIANT FEATURES
Experts
- Marc W. Howard
- Wojciech Kotlowski
- Keiichi Uchimura
- Yong Liu
- Gou Koutaki
- David G. Lowe
- Baowei Lin
- Fasheng Wang
- Sashank J. Reddi
- Francesca Odone
- Weidong Qiu
- Ian Abraham
- Xin Zhao
- Liming Chen
- Michael Bloesch
- Shinsuke Yasukawa
- Bo Zhou
- Erdem Akagündüz
- Songming Liu
- Roberto Cipolla
- Bishmoy Paul
- Facundo Bromberg
- Belma Dogdas
- Davide Scaramuzza
- Jiachen Yao
- I Gede Pasek Suta Wijaya
- Plamen Ch. Ivanov
- Kaiqi Huang
- Randolph Crawford
- Derek T. Anderson
- Tsung-Han Chan
- Kui Jia
- Karthik H. Shankar
- Ruolan Hu
- Gamini Dissanayake
- Yuchao Dai
- Fabio Bellavia
- Sanjiv Kumar
- Zhiyuan Li
Venues
- CoRR
- ICIP
- ICCV
- ICPR
- CVPR
- Multim. Tools Appl.
- IEEE Trans. Image Process.
- BMVC
- IEEE Access
- IEEE Trans. Geosci. Remote. Sens.
- ICRA
- AAAI
- Int. J. Comput. Vis.
- IEEE Trans. Pattern Anal. Mach. Intell.
- CVPR Workshops
- ICML
- J. Math. Imaging Vis.
- IEEE Geosci. Remote. Sens. Lett.
- SIU
- IEEE Trans. Signal Process.
- Vis. Comput.
- Pattern Recognit.
- Comput. Graph. Forum
- Neurocomputing
- WACV
- Symmetry
- IEICE Trans. Inf. Syst.
- IET Image Process.
- Pattern Recognit. Lett.
- IPSJ Trans. Comput. Vis. Appl.
- Neural Comput. Appl.
- FCV
- IACR Cryptol. ePrint Arch.
- ICIAP
- Expert Syst. Appl.
- Neural Comput.
- J. Electronic Imaging
- ECCV (1)
- Remote. Sens.
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