SAMPLING PROCEDURE
Experts
- Srikanta Tirthapura
- David R. Karger
- Youness Aliyari Ghassabeh
- Bojian Xu
- Peter Meer
- Keita Matsuo
- Mustapha Lebbah
- Ming-Hung Shih
- Atsushi Imiya
- Cem Kadilar
- Leonard Barolli
- Divesh Srivastava
- Kenneth L. Clarkson
- Gilles Schaeffer
- Trong Duc Nguyen
- Miralda Cuka
- Masafumi Yamada
- Peter Sanders
- Doron Rotem
- Tarn Duong
- Gaël Beck
- Iris Fermin
- Bernd Gärtner
- Eduard Sojka
- Lorenz Hübschle-Schneider
- Frank Olken
- Olivier Bodini
- Yi Liu
- Frank Rudzicz
- Javid Shabbir
- Yijie Peng
- Johannes Lengler
- Aravind Srinivasan
- Rajeev Motwani
- Milan Surkala
- Min Xu
- Dominique Poulalhon
- Gang Wu
- Saeed Alaei
Venues
- CoRR
- Commun. Stat. Simul. Comput.
- ICIP
- ICASSP
- Sensors
- SODA
- IEEE Access
- IGARSS
- Pattern Recognit. Lett.
- Pattern Recognit.
- CVPR
- Inf. Process. Lett.
- EUSIPCO
- STOC
- ISCAS
- ACM Trans. Math. Softw.
- SDM
- Model. Assist. Stat. Appl.
- IACR Cryptol. ePrint Arch.
- AAAI
- SIGMOD Conference
- Random Struct. Algorithms
- IEEE Trans. Pattern Anal. Mach. Intell.
- Kybernetika
- Appl. Math. Comput.
- IROS
- Eur. J. Oper. Res.
- IEEE Trans. Knowl. Data Eng.
- Discret. Comput. Geom.
- Entropy
- Symmetry
- Electron. Colloquium Comput. Complex.
- IET Image Process.
- Algorithmica
- VLDB
- IEEE Trans. Instrum. Meas.
- Axioms
- ICALP
- Remote. Sens.
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